Integrated NanoMaterials Laboratory Equipment
Cryogenic-Temperature Probe Station
Description: Lakeshore TTPX cryogenic-temperature probe station for device chips characterization before wire-bonding
- LN2 and LHe Temperature
- Integrated I-V & C-V measurements
- Agilent 4156C precision semiconductor parameter analyzer
- Agilent E4980A precision LCR meter, with frequency range from 20 hertz to 2 megahertz
- Fiber coupling laser beam for photo-response measurement
