Integrated NanoMaterials Laboratory Equipment

Cryogenic-Temperature Probe Station

Description: Lakeshore TTPX cryogenic-temperature probe station for device chips characterization before wire-bonding

  • LN2 and LHe Temperature
  • Integrated I-V & C-V measurements
  • Agilent 4156C precision semiconductor parameter analyzer
  • Agilent E4980A precision LCR meter, with frequency range from 20 hertz to 2 megahertz
  • Fiber coupling laser beam for photo-response measurement